Epitaxy Metrology Engineer, Augmented Reality

Job Category: Metrology Engineer
Job Type: Full Time
Job Location: United States
Company Name: Google

We are looking for a Epitaxy Metrology Engineer to join our team

Minimum qualifications:

  • Bachelor’s degree in Electrical Engineering, Computer Engineering, Computer Science, Physics, or a specialized field (e.g., Optics, Sensors, Audio/DSP, etc.), or equivalent practical experience.
  • 2 years of experience with metrology techniques in a semiconductor fabrication environment.
  • Experience with various metrology tools and techniques, such as ellipsometry, profilometry, AFM, SEM, XRD.
  • Experience with data analysis and statistical methods, such as statistical process control (SPC).

Preferred qualifications:

  • Master’s degree or PhD in Electrical Engineering, Computer Engineering, Physics, or a related field (e.g., Optics, Sensors, Audio/DSP).
  • Experience in semiconductor metrology, with a focus on epitaxial materials.
  • Experience working with external tool vendors to develop and improve metrology equipment and techniques.
  • Experience with applying measurement systems analysis for assessing tool performance.
  • Experience with semiconductor characterization techniques, and the knowledge of working principles and data interpretation.
  • Proficiency in programming languages such as Python or MATLAB for data analysis and automation.

Responsibilities

  • Employ existing and invent novel metrology methods to drive exceptional process development of monolithic display technology.
  • Work with external tool suppliers for both new equipment development and improved problem-solving capabilities.
  • Use best practices for metrology and measurement tool control and improvement, including driving a routine calibration program, measurement systems analysis (including gage Roles and Responsibilities), and SPC.
  • Aid in the early adoption of best practices in process control by documenting techniques, training technicians and engineers, and engaging in continuous improvement of metrology procedures.
  • Drive understanding of toolsets and analyses to make the most out of measurement data while also minimizing impacts to cycle time.

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